Invention Grant
US08589844B2 Methods for analyzing design rules 有权
分析设计规则的方法

Methods for analyzing design rules
Abstract:
Methods and apparatus are provided for analyzing impact of design rules on a layout. One exemplary method involves generating variants of the layout for different values for the rule, determining values of a device metric for each of the layout variants, and identifying the relationship between rule and the device metric based on the values for the device metric corresponding to the different values for the rule. In one embodiment, the layout variants are generated by using the different values for the rule to perform layout compaction on an initial layout generated in accordance with an initial value for the rule.
Public/Granted literature
Information query
Patent Agency Ranking
0/0