Invention Grant
- Patent Title: Semiconductor device manufacturing method and substrate processing apparatus
- Patent Title (中): 半导体装置的制造方法和基板处理装置
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Application No.: US13311760Application Date: 2011-12-06
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Publication No.: US08590484B2Publication Date: 2013-11-26
- Inventor: Taketoshi Sato , Masayuki Tsuneda
- Applicant: Taketoshi Sato , Masayuki Tsuneda
- Applicant Address: JP Tokyo
- Assignee: Hitachi Kokusai Electric Inc.
- Current Assignee: Hitachi Kokusai Electric Inc.
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2009-210590 20090911
- Main IPC: C23C16/455
- IPC: C23C16/455 ; C23C16/52 ; C23F1/00 ; H01L21/306 ; C23C16/06 ; C23C16/22

Abstract:
Provided is a semiconductor device manufacturing method and a substrate processing apparatus. The method comprise: a first process of forming a film containing a predetermined element on a substrate by supplying a source gas containing the predetermined element to a substrate processing chamber in which the substrate is accommodated; a second process of removing the source gas remaining in the substrate processing chamber by supplying an inert gas to the substrate processing chamber; a third process of modifying the predetermined element-containing film formed in the first process by supplying a modification gas that reacts with the predetermined element to the substrate processing chamber; a fourth process of removing the modification gas remaining in the substrate processing chamber by supplying an inert gas to the substrate processing chamber; and a filling process of filling an inert gas in a gas tank connected to the substrate processing chamber.
Public/Granted literature
- US20120073500A1 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2012-03-29
Information query
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