Invention Grant
US08592780B2 Quantum-yield measurement device 有权
量子产量测量装置

  • Patent Title: Quantum-yield measurement device
  • Patent Title (中): 量子产量测量装置
  • Application No.: US13988788
    Application Date: 2011-08-31
  • Publication No.: US08592780B2
    Publication Date: 2013-11-26
  • Inventor: Kazuya Iguchi
  • Applicant: Kazuya Iguchi
  • Applicant Address: JP Hamamatsu-shi, Shizuoka
  • Assignee: Hamamatsu Photonics K.K.
  • Current Assignee: Hamamatsu Photonics K.K.
  • Current Assignee Address: JP Hamamatsu-shi, Shizuoka
  • Agency: Drinker Biddle & Reath LLP
  • Priority: JP2010-264831 20101129
  • International Application: PCT/JP2011/069836 WO 20110831
  • International Announcement: WO2012/073567 WO 20120607
  • Main IPC: G01J5/58
  • IPC: G01J5/58
Quantum-yield measurement device
Abstract:
A quantum-yield measurement device 1 comprises a dark box 5; a light generation unit, having a light exit part 7, for generating the pumping light L1; a light detection unit, having a light entrance part 11, for detecting light to be measured L2; an integrating sphere 14, having a light entrance opening 15 for the light L1 to enter and a light exit opening 16 for the light L2 to exit; and a movement mechanism 30 for moving the sphere 14 within the box 5 such that a container 3 attains each of a first state of being located inside of the sphere 14 and a second state of being located outside of the sphere 14 and, causing the opening 15 and opening 16 to oppose the part 7 and part 11, respectively, in the first state.
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