Invention Grant
US08592790B2 Phase-change random access memory device and method of manufacturing the same 有权
相变随机存取存储器件及其制造方法

  • Patent Title: Phase-change random access memory device and method of manufacturing the same
  • Patent Title (中): 相变随机存取存储器件及其制造方法
  • Application No.: US13489816
    Application Date: 2012-06-06
  • Publication No.: US08592790B2
    Publication Date: 2013-11-26
  • Inventor: Nam Kyun Park
  • Applicant: Nam Kyun Park
  • Applicant Address: KR Gyeonggi-do
  • Assignee: SK hynix Inc.
  • Current Assignee: SK hynix Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2011-0126144 20111129
  • Main IPC: H01L29/02
  • IPC: H01L29/02
Phase-change random access memory device and method of manufacturing the same
Abstract:
A phase-change random access memory (PCRAM) device includes a semiconductor substrate; switching elements formed on the semiconductor substrate; a plurality of phase-change structures formed on the switching elements; and heat absorption layers buried between the plurality of phase-change structures, wherein the plurality of phase-change structures are insulated from the heat absorption layers.
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