Invention Grant
- Patent Title: White light optical profilometer for measuring complex surfaces
- Patent Title (中): 用于测量复杂表面的白光光学轮廓仪
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Application No.: US12966877Application Date: 2010-12-13
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Publication No.: US08593644B2Publication Date: 2013-11-26
- Inventor: Dorel Marius Necsoiu , Joseph N. Mitchell , Jason O. Burkholder , William T. Gressick
- Applicant: Dorel Marius Necsoiu , Joseph N. Mitchell , Jason O. Burkholder , William T. Gressick
- Applicant Address: US TX San Antonio
- Assignee: Southwest Research Institute
- Current Assignee: Southwest Research Institute
- Current Assignee Address: US TX San Antonio
- Agency: Chowdhury & Georgakis, P.C.
- Agent Ann C. Livingston
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B11/02 ; G01C3/00 ; G01C5/00

Abstract:
A white light optical profilometer having a measurement head that is separated from the base unit by means of a fiber optic bundle. The measurement head contains a Michelson objective, whose reference path is folded so that the measurement head may be compact. The measurement head also contains a tilting mirror, which directs light from the surface of interest to the objective, and may be adjusted to allow the measurement head to scan complex surfaces. The base unit contains the other elements of the profilometer, such as an image detector and illuminator.
Public/Granted literature
- US20120147356A1 White Light Optical Profilometer for Measuring Complex Surfaces Public/Granted day:2012-06-14
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