Invention Grant
US08593698B2 Void pantographs and methods for generating the same using at least one test void pantograph
有权
使用至少一个测试空间受电弓的无效缩放仪及其产生方法
- Patent Title: Void pantographs and methods for generating the same using at least one test void pantograph
- Patent Title (中): 使用至少一个测试空间受电弓的无效缩放仪及其产生方法
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Application No.: US13148818Application Date: 2009-02-26
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Publication No.: US08593698B2Publication Date: 2013-11-26
- Inventor: Steven J. Simske , Jason S. Aronoff , Malgorzata M. Sturgill
- Applicant: Steven J. Simske , Jason S. Aronoff , Malgorzata M. Sturgill
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- International Application: PCT/US2009/035359 WO 20090226
- International Announcement: WO2010/098760 WO 20100902
- Main IPC: G06K15/02
- IPC: G06K15/02
Abstract:
A void pantograph and a method for generating the same are disclosed herein. The void pantograph includes a foreground portion based on a region of an image that is defined using a predetermined filter, and a background portion based on another region of the image that is defined using the predetermined filter.
Public/Granted literature
- US20110310404A1 VOID PANTOGRAPHS AND METHODS FOR GENERATING THE SAME Public/Granted day:2011-12-22
Information query
