Invention Grant
- Patent Title: System and method for MR image scan and analysis
- Patent Title (中): 用于MR图像扫描和分析的系统和方法
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Application No.: US12713745Application Date: 2010-02-26
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Publication No.: US08594400B2Publication Date: 2013-11-26
- Inventor: Robert David Darrow , Thomas Kwok-Fah Foo
- Applicant: Robert David Darrow , Thomas Kwok-Fah Foo
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jenifer Haeckl
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system and method for an MRI apparatus includes an MRI system having a computer programmed to initiate a first scan procedure to acquire MR data and locate a feature of interest of the object, initiate a second scan procedure when a feature of interest of the object is located, and determine if an anomaly of the feature of interest exists. The computer is programmed to initiate a third scan procedure to scan the anomaly and reconstruct an image of the located anomaly if the anomaly exists. The first scan procedure includes a scan table motion and scan data acquisition commands. The second scan procedure includes scan table motion and scan data acquisition commands to acquire MR data from the feature of interest. The third scan procedure includes scan table motion and scan data acquisition commands to acquire MR data from the located anomaly.
Public/Granted literature
- US20110211744A1 SYSTEM AND METHOD FOR MR IMAGE SCAN AND ANALYSIS Public/Granted day:2011-09-01
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