Invention Grant
- Patent Title: System and method for testing objects using a mechanical arm
- Patent Title (中): 使用机械臂测试物体的系统和方法
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Application No.: US12824221Application Date: 2010-06-27
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Publication No.: US08594970B2Publication Date: 2013-11-26
- Inventor: Hsien-Chuan Liang , Shen-Chun Li , Shou-Kuo Hsu
- Applicant: Hsien-Chuan Liang , Shen-Chun Li , Shou-Kuo Hsu
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Altis & Wispro Law Group, Inc.
- Priority: TW99103735A 20100208
- Main IPC: G01C9/00
- IPC: G01C9/00

Abstract:
A system and method for testing objects using a mechanical arm sets one or more first positions. When a user selects one or more second positions of the mechanical arm, a distance between each of the second positions and each of the first positions is calculated. A nearest first position of each of the second positions is determined. Each of the second positions is stored in a test list corresponding to each of the nearest first positions. The mechanical arm is controlled to move to each of the nearest first positions, and tests objects located at the second positions stored in each test list corresponding to each of the nearest first positions.
Public/Granted literature
- US20110196645A1 SYSTEM AND METHOD FOR TESTING OBJECTS USING A MECHANICAL ARM Public/Granted day:2011-08-11
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