Invention Grant
- Patent Title: Debugging an integrated circuit with an embedded processor
- Patent Title (中): 使用嵌入式处理器调试集成电路
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Application No.: US13005941Application Date: 2011-01-13
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Publication No.: US08595555B1Publication Date: 2013-11-26
- Inventor: Bradley L. Taylor
- Applicant: Bradley L. Taylor
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent Kevin T. Cuenot
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method of debugging an integrated circuit (IC) can include receiving, within a debugging system implemented within the IC, a debug command from a system external to the IC and, responsive to the debug command, initiating a debug function specified by the debug command for a processor system embedded on the IC. An IC also is provided that can include a programmable circuitry (e.g., a programmable fabric) coupled via an interface to processor system embedded in the IC. A debugging system can be implemented within the programmable fabric to communicate with the processor system via the interface.
Information query