Invention Grant
US08595555B1 Debugging an integrated circuit with an embedded processor 有权
使用嵌入式处理器调试集成电路

  • Patent Title: Debugging an integrated circuit with an embedded processor
  • Patent Title (中): 使用嵌入式处理器调试集成电路
  • Application No.: US13005941
    Application Date: 2011-01-13
  • Publication No.: US08595555B1
    Publication Date: 2013-11-26
  • Inventor: Bradley L. Taylor
  • Applicant: Bradley L. Taylor
  • Applicant Address: US CA San Jose
  • Assignee: Xilinx, Inc.
  • Current Assignee: Xilinx, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Kevin T. Cuenot
  • Main IPC: G06F11/00
  • IPC: G06F11/00
Debugging an integrated circuit with an embedded processor
Abstract:
A method of debugging an integrated circuit (IC) can include receiving, within a debugging system implemented within the IC, a debug command from a system external to the IC and, responsive to the debug command, initiating a debug function specified by the debug command for a processor system embedded on the IC. An IC also is provided that can include a programmable circuitry (e.g., a programmable fabric) coupled via an interface to processor system embedded in the IC. A debugging system can be implemented within the programmable fabric to communicate with the processor system via the interface.
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