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US08595573B2 Automatic defect management in memory devices 有权
内存设备自动缺陷管理

Automatic defect management in memory devices
Abstract:
A method for data storage in a memory including multiple memory cells arranged in blocks, includes storing first and second pages in respective first and second groups of the memory cells within a given block of the memory. A pattern of respective positions of one or more defective memory cells is identified in the first group. The second page is recovered by applying the pattern identified in the first group to the second group of the memory cells.
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