A method for guiding design actions for complex failure modes in an integrated circuit (IC) design is provided in the illustrative embodiments. A probability of failure estimate of a circuit according to the IC design is received, the probability being determined using a simulation. A sensitivity of the probability of failure to a variable associated with a component in the circuit is calculated, wherein the sensitivity is determined by an estimation without the simulation. The sensitivity is depicted relative to the component in the IC design such that the sensitivity is associated with the component and a visual relationship between the component and the sensitivity is usable for adjusting a characteristic of the component to reduce the probability of failure of the circuit.