Invention Grant
- Patent Title: Method and apparatus used for the physical validation of integrated circuits
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Application No.: US13504845Application Date: 2010-10-28
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Publication No.: US08595679B2Publication Date: 2013-11-26
- Inventor: Chiu-Yu Ku
- Applicant: Chiu-Yu Ku
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Young, Basile, Hanlon & MacFarlane, P.C.
- Priority: CN200910211392 20091030
- International Application: PCT/IB2010/002782 WO 20101028
- International Announcement: WO2011/051797 WO 20110505
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Disclosed herein are methods and devices used for the physical design validation of integrated circuits. One method used for the physical design validation of integrated circuits includes comparing the original circuit netlist of an integrated circuit and the layout data of the integrated circuit and assigning labels to the input and output terminals of the components in the integrated circuit based on the results of the comparison.
Public/Granted literature
- US08826219B2 Method and apparatus used for the physical validation of integrated circuits Public/Granted day:2014-09-02
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