Invention Grant
- Patent Title: Device and tamper detection system
- Patent Title (中): 设备和篡改检测系统
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Application No.: US11939063Application Date: 2007-11-13
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Publication No.: US08595858B2Publication Date: 2013-11-26
- Inventor: Hiroki Sakai
- Applicant: Hiroki Sakai
- Applicant Address: JP Daito-shi
- Assignee: Funai Electric Co., Ltd.
- Current Assignee: Funai Electric Co., Ltd.
- Current Assignee Address: JP Daito-shi
- Agency: Crowell & Moring LLP
- Priority: JP2006-307617 20061114
- Main IPC: H04L29/06
- IPC: H04L29/06

Abstract:
Disclosed is a device including: a control section; a tamper detection section to detect changes of predetermined states of a plurality of pre-defined parts of the device, and to output detection information; a storage section to store the detection information, and request information for requesting the tamper detection section to detect a change of a predetermined state of a specific part of the plurality of parts, wherein when a main power supply section of the device is in an off-state, the electric power is supplied to the control section, the tamper detection section and the storage section from a standby power supply section, and the control section controls the tamper detection section and the storage section so that the tamper detection section detects the change of the predetermined state of the specific part in accordance with the request information, and the storage section stores the detection information.
Public/Granted literature
- US20100283604A1 Device And Tamper Detection System Public/Granted day:2010-11-11
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