Invention Grant
US08597528B1 Method and system for defining a read sensor using an ion mill planarization
有权
使用离子磨机平面化定义读取传感器的方法和系统
- Patent Title: Method and system for defining a read sensor using an ion mill planarization
- Patent Title (中): 使用离子磨机平面化定义读取传感器的方法和系统
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Application No.: US13076103Application Date: 2011-03-30
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Publication No.: US08597528B1Publication Date: 2013-12-03
- Inventor: Anup G. Roy , Ming Mao
- Applicant: Anup G. Roy , Ming Mao
- Applicant Address: US CA Fremont
- Assignee: Western Digital (Fremont), LLC
- Current Assignee: Western Digital (Fremont), LLC
- Current Assignee Address: US CA Fremont
- Main IPC: B44C1/22
- IPC: B44C1/22

Abstract:
A method and system for fabricating a magnetic transducer is described. A magnetic junction is defined from the magnetoresistive stack. The magnetic junction has a top and a plurality of sides. The step of defining the magnetic junction redeposits a portion of the magnetoresistive stack and forms fencing adjacent to the top of the magnetic junction. At least one hard bias structure is provided after the magnetic junction is defined. A first portion of the at least one hard bias structure is substantially adjacent to the magnetoresistive junction in a track-width direction. The magnetic junction is ion beam planarized, thereby substantially removing the fencing.
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