Invention Grant
US08598896B2 Electrostatic capacitance-type input device, method of testing electrostatic capacitance-type input device, and driving device for electrostatic capacitance-type input device 有权
静电电容式输入装置,静电电容式输入装置的测试方法,静电电容式输入装置的驱动装置

  • Patent Title: Electrostatic capacitance-type input device, method of testing electrostatic capacitance-type input device, and driving device for electrostatic capacitance-type input device
  • Patent Title (中): 静电电容式输入装置,静电电容式输入装置的测试方法,静电电容式输入装置的驱动装置
  • Application No.: US12961843
    Application Date: 2010-12-07
  • Publication No.: US08598896B2
    Publication Date: 2013-12-03
  • Inventor: Takeshi Kurashima
  • Applicant: Takeshi Kurashima
  • Applicant Address: JP Chita-gun, Aichi-ken
  • Assignee: Japan Display West Inc.
  • Current Assignee: Japan Display West Inc.
  • Current Assignee Address: JP Chita-gun, Aichi-ken
  • Agency: K&L Gates LLP
  • Priority: JPP2009-283727 20091215
  • Main IPC: G01R27/26
  • IPC: G01R27/26 G06F3/041
Electrostatic capacitance-type input device, method of testing electrostatic capacitance-type input device, and driving device for electrostatic capacitance-type input device
Abstract:
An electrostatic capacitance-type input device includes: a plurality of first electrodes, which detect an input position, extending in a first direction in an input area on a substrate; a plurality of second electrodes, which detect an input POSITION, extending in a second direction intersecting with the first direction in the input area; a plurality of signal wirings that extend from one-side end portions of the first electrodes and one-side end portions of the second electrodes on the substrate; a test electrode that faces the other-side end portions of at least one of the first electrodes and the second electrodes through an insulating film on the substrate; and a test wiring that is electrically connected to the test electrode.
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