Invention Grant
- Patent Title: Electrostatic capacitance-type input device, method of testing electrostatic capacitance-type input device, and driving device for electrostatic capacitance-type input device
- Patent Title (中): 静电电容式输入装置,静电电容式输入装置的测试方法,静电电容式输入装置的驱动装置
-
Application No.: US12961843Application Date: 2010-12-07
-
Publication No.: US08598896B2Publication Date: 2013-12-03
- Inventor: Takeshi Kurashima
- Applicant: Takeshi Kurashima
- Applicant Address: JP Chita-gun, Aichi-ken
- Assignee: Japan Display West Inc.
- Current Assignee: Japan Display West Inc.
- Current Assignee Address: JP Chita-gun, Aichi-ken
- Agency: K&L Gates LLP
- Priority: JPP2009-283727 20091215
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G06F3/041

Abstract:
An electrostatic capacitance-type input device includes: a plurality of first electrodes, which detect an input position, extending in a first direction in an input area on a substrate; a plurality of second electrodes, which detect an input POSITION, extending in a second direction intersecting with the first direction in the input area; a plurality of signal wirings that extend from one-side end portions of the first electrodes and one-side end portions of the second electrodes on the substrate; a test electrode that faces the other-side end portions of at least one of the first electrodes and the second electrodes through an insulating film on the substrate; and a test wiring that is electrically connected to the test electrode.
Public/Granted literature
Information query