Invention Grant
US08598943B2 Semiconductor integrated circuit with stable rupture voltage fuse
有权
半导体集成电路具有稳定的断裂电压保险丝
- Patent Title: Semiconductor integrated circuit with stable rupture voltage fuse
- Patent Title (中): 半导体集成电路具有稳定的断裂电压保险丝
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Application No.: US13219636Application Date: 2011-08-27
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Publication No.: US08598943B2Publication Date: 2013-12-03
- Inventor: Sang Mook Oh , Jae Hyuk Im
- Applicant: Sang Mook Oh , Jae Hyuk Im
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Patent Ltd.
- Priority: KR10-2011-0027575 20110328
- Main IPC: H01H37/76
- IPC: H01H37/76
Abstract:
A semiconductor integrated circuit includes a fuse set; a terminal assigned to be applied with a first external signal in a normal operation; and a control unit configured to receive a second external signal through the terminal and apply the received second external signal to the fuse set in a fuse control operation.
Public/Granted literature
- US20120249221A1 SEMICONDUCTOR INTEGRATED CIRCUIT Public/Granted day:2012-10-04
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