Invention Grant
- Patent Title: Jitter addition apparatus and test apparatus
- Patent Title (中): 抖动添加装置和测试装置
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Application No.: US12629400Application Date: 2009-12-02
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Publication No.: US08599910B2Publication Date: 2013-12-03
- Inventor: Kenichi Nagatani , Takayuki Nakamura
- Applicant: Kenichi Nagatani , Takayuki Nakamura
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2008-314744 20081210
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
Provided is a jitter injection apparatus that injects jitter into a signal, comprising: a plurality of jitter injecting sections that are provided in series in a transmission path that propagates the signal; an output section that selects the signal that is passed from a jitter injecting section at a first stage through a designated jitter injecting section, and outputs the selected signal; and a plurality of branch-path jitter injecting sections that (i) are provided in a plurality of branch paths that propagate the signal output by each jitter injecting section from the transmission path to the output section and (ii) are relays having frequency characteristics of attenuating a high-frequency band more than a low-frequency band.
Public/Granted literature
- US20100158092A1 JITTER ADDITION APPARATUS AND TEST APPARATUS Public/Granted day:2010-06-24
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