Invention Grant
US08600487B2 System and method for exploiting atrial electrocardiac parameters in assessing left atrial pressure using an implantable medical device 有权
使用可植入医疗器械评估左心房压力的心房心电图参数的开发系统和方法

  • Patent Title: System and method for exploiting atrial electrocardiac parameters in assessing left atrial pressure using an implantable medical device
  • Patent Title (中): 使用可植入医疗器械评估左心房压力的心房心电图参数的开发系统和方法
  • Application No.: US12713019
    Application Date: 2010-02-25
  • Publication No.: US08600487B2
    Publication Date: 2013-12-03
  • Inventor: Alex SorianoGene A. Bornzin
  • Applicant: Alex SorianoGene A. Bornzin
  • Applicant Address: US CA Sylmar
  • Assignee: Pacesetter, Inc.
  • Current Assignee: Pacesetter, Inc.
  • Current Assignee Address: US CA Sylmar
  • Main IPC: A61B5/0452
  • IPC: A61B5/0452
System and method for exploiting atrial electrocardiac parameters in assessing left atrial pressure using an implantable medical device
Abstract:
Techniques are provided for assessing left atrial pressure (LAP) based on atrial electrocardiac signal parameters, particularly intra-atrial conduction delay (IACD) and P-wave duration. In one example, a pacemaker or other implantable device senses an intracardiac electrogram (IEGM) or a subcutaneous electrocardiogram (ECG), from which IACD and P-wave duration are derived. The device tracks changes, if any, in the parameters. A significant increase in either IACD or P-wave duration is associated with an increase in LAP. In some examples, conversion factors are calibrated for use with a particular patient to relate IACD and/or P-wave duration values to LAP values to provide an estimate of actual LAP. The conversion factors are pre-calibrated using LAP measurements obtained using a wedge pressure sensor. In other examples, IACD and P-wave duration are instead used to confirm the detection of an elevation in LAP initially made using impedance signals. Other confirmation parameters are described as well.
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