Invention Grant
US08600705B2 Method and apparatus for measuring internal quantum well efficiency of LED
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测量LED内部量子阱效率的方法和装置
- Patent Title: Method and apparatus for measuring internal quantum well efficiency of LED
- Patent Title (中): 测量LED内部量子阱效率的方法和装置
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Application No.: US12905876Application Date: 2010-10-15
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Publication No.: US08600705B2Publication Date: 2013-12-03
- Inventor: Jong-In Shim , Hyunsung Kim
- Applicant: Jong-In Shim , Hyunsung Kim
- Applicant Address: KR
- Assignee: Industry-University Cooperation Foundation Hanyang University
- Current Assignee: Industry-University Cooperation Foundation Hanyang University
- Current Assignee Address: KR
- Priority: KR10-2010-0003836 20100115
- Main IPC: G06F3/023
- IPC: G06F3/023 ; G06F3/01 ; G06F3/06 ; G06F3/14

Abstract:
Provided is a method and apparatus for measuring efficiency of an optical device. In the method, a power of emission light from the optical device is calculated by irradiating an excitation stimulus on the optical device. A power of a reference excitation stimulus at which a variation of recombination coefficients in a quantum well of the optical device with respect to a variation of carrier concentration in the quantum well of the optical device becomes minimum is extracted. An internal quantum efficiency of the optical device at the power of the reference excitation stimulus is calculated. An internal quantum efficiency of the optical device at powers of various excitation stimuli is calculated from the internal quantum efficiency of the optical device at the power of the reference excitation stimulus.
Public/Granted literature
- US20110178770A1 METHOD AND APPARATUS FOR MEASURING INTERNAL QUANTUM WELL EFFICIENCY OF LED Public/Granted day:2011-07-21
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