A test apparatus includes: a test executing section executing a test on the device under test; a fail memory storing a test result outputted by the test executing section, the fail memory implementing an interleave technology for interleaving accesses to a plurality of banks; a buffer memory storing the test result transferred from the fail memory and transfers at least part of the test result to a cache memory, the buffer memory being either a memory not implementing the interleave technology or a memory implementing the interleave technology but having a smaller number of banks than the fail memory; the cache memory storing the at least part of the test result transferred from the buffer memory, the cache memory allowing random access in shorter time than the buffer memory does; and an analysis section analyzing the test result stored in the cache memory.