Invention Grant
- Patent Title: Pre-colored methodology of multiple patterning
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Application No.: US13586177Application Date: 2012-08-15
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Publication No.: US08601411B2Publication Date: 2013-12-03
- Inventor: Yen-Huei Chen , Wei Min Chan , Hung-Jen Liao , Jonathan Tsung-Yung Chang
- Applicant: Yen-Huei Chen , Wei Min Chan , Hung-Jen Liao , Jonathan Tsung-Yung Chang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Associates, LLC
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Some embodiments relate to a method for pre-coloring data within an integrated chip layout to avoid overlay errors that result from mask misalignment during multiple patterning lithography. The method may be performed by generating a graphical IC layout file containing an integrated chip layout having a plurality of IC shapes. The IC shapes within the graphical IC layout file are assigned a color during decomposition. The IC shapes are further pre-colored in a manner that deliberately assigns the pre-colored data to a same mask. During mask building data associated with IC shapes that have been pre-colored is automatically sent to a same mask, regardless of the colors that are assigned to the shapes. Therefore, the pre-colored shapes are not assigned to a masked based upon a decomposition, but rather based upon the pre-coloring. By assigning IC shapes to a same mask through pre-coloring, overlay errors can be reduced.
Public/Granted literature
- US20130263065A1 PRE-COLORED METHODOLOGY OF MULTIPLE PATTERNING Public/Granted day:2013-10-03
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