Invention Grant
- Patent Title: Cantilever for scanning probe microscope and scanning probe microscope equipped with it
- Patent Title (中): 悬臂扫描探针显微镜和扫描探针显微镜配备
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Application No.: US11887348Application Date: 2006-03-30
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Publication No.: US08601608B2Publication Date: 2013-12-03
- Inventor: Kenichi Maruyama , Koji Suzuki , Masato Iyoki
- Applicant: Kenichi Maruyama , Koji Suzuki , Masato Iyoki
- Applicant Address: JP Kawaguchi-shi JP Chiba-shi
- Assignee: Japan Science and Technology Agency,SII Nanotechnology Inc.
- Current Assignee: Japan Science and Technology Agency,SII Nanotechnology Inc.
- Current Assignee Address: JP Kawaguchi-shi JP Chiba-shi
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2005-100934 20050331
- International Application: PCT/JP2006/306648 WO 20060330
- International Announcement: WO2006/106818 WO 20061012
- Main IPC: G01Q60/22
- IPC: G01Q60/22

Abstract:
A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer; the metal layer is further coated with an insulating layer; the insulating layer is removed only at the distal end to expose the metal layer; the slightly exposed metal layer is employed as a working electrode; and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope.
Public/Granted literature
- US20100154085A1 Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It Public/Granted day:2010-06-17
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