Invention Grant
US08601608B2 Cantilever for scanning probe microscope and scanning probe microscope equipped with it 有权
悬臂扫描探针显微镜和扫描探针显微镜配备

Cantilever for scanning probe microscope and scanning probe microscope equipped with it
Abstract:
A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer; the metal layer is further coated with an insulating layer; the insulating layer is removed only at the distal end to expose the metal layer; the slightly exposed metal layer is employed as a working electrode; and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope.
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