Invention Grant
- Patent Title: Oversampled data processing circuit with multiple detectors
- Patent Title (中): 具有多个检测器的过采样数据处理电路
-
Application No.: US13545784Application Date: 2012-07-10
-
Publication No.: US08604960B2Publication Date: 2013-12-10
- Inventor: Yu Liao , Nayak Ratnakar Aravind
- Applicant: Yu Liao , Nayak Ratnakar Aravind
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hamilton DeSanctis & Cha
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
Various embodiments of the present invention provide apparatuses and methods for processing data in an oversampled data processing circuit with multiple detectors. For example, an apparatus for processing data is disclosed that includes a first analog to digital converter operable to sample a continuous signal at a first sampling phase to yield a first digital output, a second analog to digital converter operable to sample the continuous signal at a second sampling phase to yield a second digital output, wherein the second sampling phase is different from the first sampling phase, a first detector operable to process the first digital output to yield a first detector output, and a second detector operable to process the second digital output and the first detector output to yield a detected output.
Public/Granted literature
- US20130106637A1 Oversampled Data Processing Circuit With Multiple Detectors Public/Granted day:2013-05-02
Information query