Invention Grant
- Patent Title: System and method for testing an electronic device
- Patent Title (中): 用于测试电子设备的系统和方法
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Application No.: US12830111Application Date: 2010-07-02
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Publication No.: US08606537B2Publication Date: 2013-12-10
- Inventor: Tam Lien , Thomas Ackermann
- Applicant: Tam Lien , Thomas Ackermann
- Applicant Address: DE Dusseldorf
- Assignee: Vodafone Holding GmbH
- Current Assignee: Vodafone Holding GmbH
- Current Assignee Address: DE Dusseldorf
- Agency: International IP Law Group, PLLC
- Priority: DE102009032197 20090707
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
There is provided a system for testing an electronic device in a test arrangement. The test arrangement includes a data interface and a user interface that is configured to output user outputs comprising image and/or audio information. The exemplary system comprises an automation unit configured to be connected via a data connection to the data interface. The user outputs are provided as output via the data interface and can be transmitted via the data connection to the automation unit. The automation unit is configured to carry out an evaluation of the user outputs.
Public/Granted literature
- US20110054824A1 SYSTEM AND METHOD FOR TESTING AN ELECTRONIC DEVICE Public/Granted day:2011-03-03
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