Invention Grant
US08607121B2 Selective error detection and error correction for a memory interface 有权
存储器接口的选择性错误检测和纠错

Selective error detection and error correction for a memory interface
Abstract:
Error correction code (ECC) checkbits are generated for each write access to a memory address based on both the data to be written (the write data) and the memory address. The ECC checkbits are stored with the write data at the memory device associated with the memory address. In addition, the memory device can selectively perform error detection and correction for write accesses using the ECC checkbits. For example, the memory device can include an ECC control register that stores control information to selectively enable and disable error detection and correction for write accesses. In an embodiment, error detection and correction can be selectively enabled and disabled for different sizes of write data.
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