Invention Grant
- Patent Title: Contour alignment for model calibration
- Patent Title (中): 模型校准的轮廓对齐
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Application No.: US13092440Application Date: 2011-04-22
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Publication No.: US08607168B2Publication Date: 2013-12-10
- Inventor: Ir Kusnadi , Thuy Q Do , Yuri Granik , John L Sturtevant
- Applicant: Ir Kusnadi , Thuy Q Do , Yuri Granik , John L Sturtevant
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Techniques for model calibration and alignment of measurement contours of printed layout features with simulation contours obtained with a model are disclosed. With various implementations of the invention, contour point errors are determined. Based on the contour point errors and a cost function, values of alignment parameters may be determined. The values of alignment parameters may be used to realign the measurement contours for model calibration. The alignment may be conducted concurrently with model calibration.
Public/Granted literature
- US20110202898A1 Contour Alignment For Model Calibration Public/Granted day:2011-08-18
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