Invention Grant
- Patent Title: Verification module apparatus to serve as a prototype for functionally debugging an electronic design that exceeds the capacity of a single FPGA
- Patent Title (中): 验证模块设备用作功能调试超过单个FPGA容量的电子设计的原型
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Application No.: US13543854Application Date: 2012-07-08
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Publication No.: US08607174B2Publication Date: 2013-12-10
- Inventor: Mon-Ren Chene
- Applicant: Mon-Ren Chene
- Applicant Address: US CA San Jose
- Assignee: S2C Inc.
- Current Assignee: S2C Inc.
- Current Assignee Address: US CA San Jose
- Agency: Patentry
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F17/50

Abstract:
A plurality of FPGAs and off-chip storage devices provide a verification module for functionally debugging electronic circuit designs. Signal value compression circuits embedded in each FPGA conserve the limited number of pins available on each FPGA. Transmitting addresses to signal values previously stored in off-chip storage further reduce the bottlenecks in analyzing logic functionality distributed across multiple FPGAs.
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