Invention Grant
US08611053B2 Current-perpendicular-to-the-plane (CPP) magnetoresistive sensor with multilayer reference layer including a Heusler alloy
有权
具有包括Heusler合金的多层参考层的电流垂直平面(CPP)磁阻传感器
- Patent Title: Current-perpendicular-to-the-plane (CPP) magnetoresistive sensor with multilayer reference layer including a Heusler alloy
- Patent Title (中): 具有包括Heusler合金的多层参考层的电流垂直平面(CPP)磁阻传感器
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Application No.: US13415813Application Date: 2012-03-08
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Publication No.: US08611053B2Publication Date: 2013-12-17
- Inventor: Elizabeth Ann Brinkman , Matthew J. Carey , Jeffrey R. Childress , Young-suk Choi , Brian R. York
- Applicant: Elizabeth Ann Brinkman , Matthew J. Carey , Jeffrey R. Childress , Young-suk Choi , Brian R. York
- Applicant Address: NL Amsterdam
- Assignee: HGST Netherlands B.V.
- Current Assignee: HGST Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agent Thomas R. Berthold
- Main IPC: G11B5/39
- IPC: G11B5/39

Abstract:
A current-perpendicular-to-the-plane giant magnetoresistance (CPP-GMR) sensor has a multilayer reference layer containing a Heusler alloy. The multilayer reference layer may be a simple pinned layer or the AP2 layer of an antiparallel (AP)-pinned structure. The multilayer reference layer is formed of a crystalline non-Heusler alloy ferromagnetic layer on either an antiferromagnetic layer (in a simple pinned structure) or an antiparallel coupling (APC) layer (in an AP-pinned structure), a Heusler alloy layer adjacent the sensor's nonmagnetic electrically conducting spacer layer, and an intermediate substantially non-crystalline X-containing layer between the crystalline non-Heusler alloy layer and the Heusler alloy layer. The element X is selected from one or more of tantalum (Ta), hafnium (Hf), niobium (Nb) and boron (B).
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