Invention Grant
- Patent Title: Systems and methods for erasing charge-trap flash memory
- Patent Title (中): 擦除电荷陷阱闪存的系统和方法
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Application No.: US13220883Application Date: 2011-08-30
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Publication No.: US08611158B2Publication Date: 2013-12-17
- Inventor: Diego Della Mina , Chiara Missiroli , Osama Khouri
- Applicant: Diego Della Mina , Chiara Missiroli , Osama Khouri
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Morrison & Foerster LLP
- Main IPC: G11C16/14
- IPC: G11C16/14 ; G11C16/16 ; G11C16/06

Abstract:
FLASH memory device contains at least one memory stack. The stack of transistors includes a first (or source) selector transistor, a second (or drain) selector transistor, and a plurality memory cell transistors connected in series therebetween. During an erase operation, each of the first and second selector transistors has a bias applied that releases the select transistors from an electrically floating state together with biasing each of the memory cell transistors.
Public/Granted literature
- US20130051156A1 SYSTEMS AND METHODS FOR ERASING CHARGE-TRAP FLASH MEMORY Public/Granted day:2013-02-28
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