Invention Grant
- Patent Title: Method for measuring signal quality in WDM optical networks
- Patent Title (中): WDM光网络信号质量测量方法
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Application No.: US12614469Application Date: 2009-11-09
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Publication No.: US08611741B2Publication Date: 2013-12-17
- Inventor: Mark Feuer , Mikhail Brodsky
- Applicant: Mark Feuer , Mikhail Brodsky
- Applicant Address: US GA Atlanta
- Assignee: AT&T Intellectual Property I, L.P.
- Current Assignee: AT&T Intellectual Property I, L.P.
- Current Assignee Address: US GA Atlanta
- Agency: Wolff & Samson, PC
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B17/00 ; H04J14/00 ; H04J4/00

Abstract:
A method and memory medium in a wavelength division multiplexing (WDM) network that communicates multiplexed signals representing a plurality of communication channels to determine received signal quality are disclosed. Generally, the signals format the plurality of communication channels to impart a distinctive noise profile in time or frequency for each channel; and collectively process the channels at a digital signal processing device to measure the signal-to-noise ratio.
Public/Granted literature
- US20110110657A1 Method for Measuring Signal Quality in WDM Optical Networks Public/Granted day:2011-05-12
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