Invention Grant
- Patent Title: Quality control methods for the manufacture of polymer arrays
- Patent Title (中): 用于制造聚合物阵列的质量控制方法
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Application No.: US11646600Application Date: 2006-12-28
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Publication No.: US08614086B2Publication Date: 2013-12-24
- Inventor: Gordon Holt , Ghadeer Antanius , Brandon Barnett
- Applicant: Gordon Holt , Ghadeer Antanius , Brandon Barnett
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: C12M1/00
- IPC: C12M1/00 ; C12M1/34 ; C12Q1/68 ; G01N27/00 ; C07H21/00
Abstract:
Described are quality control methods and devices for the reproducible manufacturing and integrity monitoring of polymers on electrochemical synthesis and detection chips. The devices and methods allow for simultaneous manufacturing and synthesis of polymers.
Public/Granted literature
- US20080157786A1 Quality control methods for the manufacture of polymer arrays Public/Granted day:2008-07-03
Information query
