Invention Grant
US08614445B2 Alkylsilane laminate, production method thereof and thin-film transistor
有权
烷基硅烷层压体,其制造方法和薄膜晶体管
- Patent Title: Alkylsilane laminate, production method thereof and thin-film transistor
- Patent Title (中): 烷基硅烷层压体,其制造方法和薄膜晶体管
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Application No.: US13322830Application Date: 2010-05-27
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Publication No.: US08614445B2Publication Date: 2013-12-24
- Inventor: Takashi Kushida , Hiroyoshi Naito
- Applicant: Takashi Kushida , Hiroyoshi Naito
- Applicant Address: JP Osaka
- Assignee: Teijin Limited
- Current Assignee: Teijin Limited
- Current Assignee Address: JP Osaka
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-129173 20090528; JP2009-129190 20090528
- International Application: PCT/JP2010/059032 WO 20100527
- International Announcement: WO2010/137664 WO 20101202
- Main IPC: H01L29/04
- IPC: H01L29/04

Abstract:
Provided is an alkylsilane laminate with which it is possible to obtain an organic semiconductor film having excellent semiconductor properties. Such a laminate can be useful for an organic thin-film transistor. The alkylsilane laminate comprises an underlayer (Sub) having hydroxyl groups at the surface and an alkylsilane thin film (AS) formed on this underlayer. The alkylsilane laminate is a laminate wherein the critical surface energy Ec of the alkylsilane thin film and the number of carbons (X) of the alkylsilane satisfies the following formula (1): Ec≦29.00−0.63x (mN/m) (1) Also provided is a thin-film transistor (10) having such an alkylsilane laminate (Sub, AS).
Public/Granted literature
- US08569756B2 Alkylsilane laminate, production method thereof and thin-film transistor Public/Granted day:2013-10-29
Information query
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