Invention Grant
- Patent Title: High reliability processor system
- Patent Title (中): 高可靠性处理器系统
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Application No.: US13088597Application Date: 2011-04-18
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Publication No.: US08615684B2Publication Date: 2013-12-24
- Inventor: Jeffrey Hering
- Applicant: Jeffrey Hering
- Applicant Address: US WI Milwaukee
- Assignee: Astronautics Corporation of America
- Current Assignee: Astronautics Corporation of America
- Current Assignee Address: US WI Milwaukee
- Agency: Boyle Fredrickson S.C.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A method of testing the integrity of microprogramming within a computer processor employs a test calculation designed to exercise instructions and to reveal errors in those instructions. The problem of testing instructions using the very instructions which may possibly be corrupt is addressed by developing a signature passed from instruction to instruction providing a low likelihood of a false positive outcome. A time-out system is used in the evaluation of the test calculation to capture a wide variety of other pathological operating conditions.
Public/Granted literature
- US20120265973A1 High Reliability Processor System Public/Granted day:2012-10-18
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