Invention Grant
- Patent Title: Autonomic hotspot profiling using paired performance sampling
- Patent Title (中): 使用配对性能采样的自动热点分析
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Application No.: US12946959Application Date: 2010-11-16
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Publication No.: US08615742B2Publication Date: 2013-12-24
- Inventor: Venkat Rajeev Indukuru , Daniel Owen , Alexander Erik Mericas , John Fred Spannaus
- Applicant: Venkat Rajeev Indukuru , Daniel Owen , Alexander Erik Mericas , John Fred Spannaus
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Robert H. Frantz; David A. Mims, Jr.
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/45

Abstract:
A processor performance profiler is enabled to for identify specific instructions causing performance issues within a program being executed by a microprocessor through random sampling to find the worst-case offenders of a particular event type such as a cache miss or a branch mis-prediction. Tracking all instructions causing a particular event generates large data logs, creates performance penalties, and makes code analysis more difficult. However, by identifying and tracking the worst offenders within a random sample of events without having to hash all events results in smaller memory requirements for the performance profiler, lower performance impact while profiling, and decreased complexity to analyze the program to identify major performance issues, which, in turn, enables better optimization of the program in shorter developer time.
Public/Granted literature
- US20120124560A1 Autonomic Hotspot Profiling Using Paired Performance Sampling Public/Granted day:2012-05-17
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