Invention Grant
- Patent Title: High-speed optical measurement apparatus
- Patent Title (中): 高速光学测量仪器
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Application No.: US13153442Application Date: 2011-06-05
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Publication No.: US08619259B2Publication Date: 2013-12-31
- Inventor: Seong Weon Lee , Sang Young Chin , Gyung Su Moon
- Applicant: Seong Weon Lee , Sang Young Chin , Gyung Su Moon
- Applicant Address: KR Suwon
- Assignee: ENC Technology Co., Ltd.
- Current Assignee: ENC Technology Co., Ltd.
- Current Assignee Address: KR Suwon
- Agency: LRK Patent Law Firm
- Priority: KR10-2010-0053827 20100608
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A high-speed optical measurement apparatus includes an objective lens unit, an optical path unit, a control circuit unit, a measurement sensor, an eyepiece unit, and a measurement sensor connection. The objective lens unit adjusts the magnitude of the overall light of the individual locations of the object or the set of multiple objects, and allows the light to make its entrance. The optical path unit changes the path of the incident light. The control circuit unit outputs a control signal which is used to change a direction of the light by controlling the optical path unit. The measurement sensor measures the incident light. The eyepiece unit conforms the light to the size and location of the measurement sensor. The measurement sensor connection fastens the measurement sensor so that the light incoming through the eyepiece unit is aligned with the measurement sensor.
Public/Granted literature
- US20110299087A1 HIGH-SPEED OPTICAL MEASUREMENT APPARATUS Public/Granted day:2011-12-08
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