Invention Grant
- Patent Title: Method and device for determining images from X-ray projections
- Patent Title (中): 用于从X射线投影确定图像的方法和装置
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Application No.: US12772793Application Date: 2010-05-03
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Publication No.: US08619944B2Publication Date: 2013-12-31
- Inventor: Frank Dennerlein , Stefan Hoppe , Markus Kowarschik , Holger Scherl
- Applicant: Frank Dennerlein , Stefan Hoppe , Markus Kowarschik , Holger Scherl
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Agency: Lempia Summerfield Katz LLC
- Priority: DE102009020400 20090508
- Main IPC: A61B6/03
- IPC: A61B6/03

Abstract:
A method and a device for determining attenuation coefficients for an object using a movable X-ray source and a detector, which is provided for recording projections, is provided. The method includes specifying a trajectory for the movable X-ray source, specifying positions on the trajectory for determining a derivative of projections recorded by the detector, specifying a plurality of scanning positions for each of the specified positions, following the trajectory with the X-ray source and recording a projection for each scanning position, numerically calculating a projection derivative in relation to the trajectory path for each of the positions using the projections recorded for the associated plurality of scanning positions, and determining attenuation coefficients for the object from the calculated projection derivatives using a theoretically exact or approximate rule for the reconstruction.
Public/Granted literature
- US20100286928A1 METHOD AND DEVICE FOR DETERMINING IMAGES FROM X-RAY PROJECTIONS Public/Granted day:2010-11-11
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