Invention Grant
- Patent Title: Surface measurement system and method
- Patent Title (中): 表面测量系统及方法
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Application No.: US13171516Application Date: 2011-06-29
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Publication No.: US08620033B2Publication Date: 2013-12-31
- Inventor: Raymond Bitzel, Jr. , Johnathan Jones
- Applicant: Raymond Bitzel, Jr. , Johnathan Jones
- Applicant Address: US CO Golden
- Assignee: Wheelabrator Group, Inc.
- Current Assignee: Wheelabrator Group, Inc.
- Current Assignee Address: US CO Golden
- Agency: Lando & Anastasi, LLP
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A surface measurement method includes inspecting a plurality of samples of a first irregular workpiece surface in two dimensions, determining, based on the inspections of the samples, a total number of surface peaks on each of the plurality of samples, and deriving a control limit from a statistical variation of the total number of surface peaks on each of the samples. The control limit specifies an out-of-tolerance condition for the total number of surface peaks on a second irregular workpiece surface. The method further includes inspecting a portion of the second irregular workpiece surface in two dimensions, determining, based on the inspection of the portion of the second irregular workpiece surface, a total number of surface peaks on the portion, and comparing the total number of surface peaks on the portion to the control limit to determine whether the second irregular workpiece surface is in the out-of-tolerance condition.
Public/Granted literature
- US20130002444A1 SURFACE MEASUREMENT SYSTEM AND METHOD Public/Granted day:2013-01-03
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