Invention Grant
- Patent Title: Electrical-mechanical complex sensor for nanomaterials
- Patent Title (中): 纳米材料机电复合传感器
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Application No.: US13821708Application Date: 2011-01-10
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Publication No.: US08621661B2Publication Date: 2013-12-31
- Inventor: Seung Hoon Nahm , Hoon Sik Jang , Sang Gu Jeon , Min Seok Kim
- Applicant: Seung Hoon Nahm , Hoon Sik Jang , Sang Gu Jeon , Min Seok Kim
- Applicant Address: KR Daejeon
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR Daejeon
- Agency: Lowe Hauptman & Ham, LLP
- International Application: PCT/KR2011/000145 WO 20110110
- International Announcement: WO2012/096416 WO 20120719
- Main IPC: G01N3/08
- IPC: G01N3/08 ; B81B7/02 ; G01R31/00

Abstract:
Disclosed is an electrical-mechanical complex sensor for nanomaterials, including: a detector having a piezoelectric film therein, for measuring a mechanical property of a nanomaterial when a bending or tensile load is applied to the nanomaterial; a first detection film formed at an end of the detector to measure the mechanical property and an electrical property of the nanomaterial) in real time at the same time, when the nanomaterial contacts the first detection film; and a support to which one end of the detector is integrally connected, for supporting the detector.
Public/Granted literature
- US20130167272A1 ELECTRICAL-MECHANICAL COMPLEX SENSOR FOR NANOMATERIALS Public/Granted day:2013-06-27
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