Invention Grant
- Patent Title: Testing apparatus
- Patent Title (中): 测试仪器
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Application No.: US13474812Application Date: 2012-05-18
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Publication No.: US08621933B2Publication Date: 2014-01-07
- Inventor: Yu-Lan Liu , Wei-Min Qin , Yu-Lin Liu
- Applicant: Yu-Lan Liu , Wei-Min Qin , Yu-Lin Liu
- Applicant Address: CN Wuhan TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Wuhan TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201110408400 20111209
- Main IPC: G01L1/00
- IPC: G01L1/00 ; G01B5/30 ; G01B7/16 ; G01N3/00

Abstract:
A testing apparatus includes a securing member, a first clipping panel, a second clipping panel, two mounting members, and a sliding member. The securing member includes a screw pole. The first clipping panel is secured to the screw pole. The second clipping panel is moveably attached to the screw pole, and the first clipping panel and the second clipping panel are attached to opposite side plates of an electronic device. The two mounting members are attached to the screw pole and located on opposite sides of the second clipping panel, for preventing the second clipping panel from disengaging from the electronic device. The sliding member is slidably attached to the screw pole and located between the first clipping panel and the second clipping panel, for moving the electronic device.
Public/Granted literature
- US20130145855A1 TESTING APPARATUS Public/Granted day:2013-06-13
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