Invention Grant
- Patent Title: Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
- Patent Title (中): 使用定位有效光斑的方法来定位光学测量的有效光斑和光学测量仪器的方法
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Application No.: US13156013Application Date: 2011-06-08
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Publication No.: US08622546B2Publication Date: 2014-01-07
- Inventor: Stephen W. Farrer , Thomas D. Raymond , Wei Xiong , John Dixson , Daniel R. Neal
- Applicant: Stephen W. Farrer , Thomas D. Raymond , Wei Xiong , John Dixson , Daniel R. Neal
- Applicant Address: US CA Santa Ana
- Assignee: AMO Wavefront Sciences, LLC
- Current Assignee: AMO Wavefront Sciences, LLC
- Current Assignee Address: US CA Santa Ana
- Agency: AMO Wavefront Sciences, LLC
- Main IPC: A61B3/00
- IPC: A61B3/00 ; A61B3/10

Abstract:
An algorithm locates valid light spots produced on an image detector by a wavefront of interest. The algorithm includes sequentially examining pixels of the image detector to determine for each of the pixels whether the light intensity detected by the pixel is greater than a threshold, When the pixel's detected light intensity is determined to be greater than the threshold, the algorithm includes: determining whether the pixel belongs to a valid light spot; and when the pixel is determined to belong to a valid light spot; saving data indicating a location for the valid light spot; and masking out a group of pixels of the image detector at the determined location such that the masked pixels are considered to have a light intensity less than the threshold for a remainder of the sequential examination.
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