Invention Grant
US08622546B2 Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots 有权
使用定位有效光斑的方法来定位光学测量的有效光斑和光学测量仪器的方法

Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
Abstract:
An algorithm locates valid light spots produced on an image detector by a wavefront of interest. The algorithm includes sequentially examining pixels of the image detector to determine for each of the pixels whether the light intensity detected by the pixel is greater than a threshold, When the pixel's detected light intensity is determined to be greater than the threshold, the algorithm includes: determining whether the pixel belongs to a valid light spot; and when the pixel is determined to belong to a valid light spot; saving data indicating a location for the valid light spot; and masking out a group of pixels of the image detector at the determined location such that the masked pixels are considered to have a light intensity less than the threshold for a remainder of the sequential examination.
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