Invention Grant
- Patent Title: Structure and method for post oxidation silicon trench bottom shaping
- Patent Title (中): 后氧化硅沟槽底部成形的结构和方法
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Application No.: US13015448Application Date: 2011-01-27
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Publication No.: US08624302B2Publication Date: 2014-01-07
- Inventor: Matthew A. Ring , Henry G. Prosack, Jr.
- Applicant: Matthew A. Ring , Henry G. Prosack, Jr.
- Applicant Address: US ME South Portland
- Assignee: Fairchild Semiconductor Corporation
- Current Assignee: Fairchild Semiconductor Corporation
- Current Assignee Address: US ME South Portland
- Main IPC: H01L27/06
- IPC: H01L27/06

Abstract:
A method of fabricating an LFCC device includes forming a first trench in a substrate that extends vertically from an upper surface to a depth within the substrate, the first trench having first sidewalls, a first bottom, and a pattern formed on the first sidewalls near the first bottom of the trench, and forming an oxide layer on the first sidewalls and first bottom of the first trench that leaves a second trench located within the first trench and is separated from the first trench by the oxide layer. The second trench has second sidewalls that are substantially vertical without showing the pattern and a second bottom that is substantially flat. The pattern compensates for the difference in oxidation rates between the bottom of the first trench and the first sidewalls. The LFCC structure includes a first trench with the pattern.
Public/Granted literature
- US20110193142A1 Structure and Method for Post Oxidation Silicon Trench Bottom Shaping Public/Granted day:2011-08-11
Information query
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