Invention Grant
- Patent Title: Nonvolatile semiconductor memory device and method of fabricating the same
- Patent Title (中): 非易失性半导体存储器件及其制造方法
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Application No.: US13227882Application Date: 2011-09-08
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Publication No.: US08624316B2Publication Date: 2014-01-07
- Inventor: Ichiro Mizushima , Yoshiaki Fukuzumi , Shinji Mori
- Applicant: Ichiro Mizushima , Yoshiaki Fukuzumi , Shinji Mori
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-065282 20110324
- Main IPC: H01L29/792
- IPC: H01L29/792

Abstract:
According to one embodiment, a semiconductor device, including a substrate, a stacked layer body provided above the substrate, the stacked layer body alternately stacking an insulator and an electrode film one on another, silicon pillars contained with fluorine, the silicon pillar penetrating through and provided in the stacked layer body, a tunnel insulator provided on a surface of the silicon pillar facing to the stacked layer body, a charge storage layer provided on a surface of the tunnel insulator facing to the stacked layer body, a block insulator provided on a surface of the charge storage layer facing to the stacked layer body, the block insulator being in contact with the electrode film, and an embedded portion provided in the silicon pillars.
Public/Granted literature
- US20120241841A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2012-09-27
Information query
IPC分类: