Invention Grant
- Patent Title: Chip design with robust corner bumps
- Patent Title (中): 芯片设计具有坚固的拐角凸起
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Application No.: US12842731Application Date: 2010-07-23
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Publication No.: US08624391B2Publication Date: 2014-01-07
- Inventor: Hsien-Wei Chen
- Applicant: Hsien-Wei Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
An integrated circuit structure includes a semiconductor chip, which includes a corner, a side, and a center. The semiconductor chip further includes a plurality of bump pad structures distributed on a major surface of a substrate; a first region of the substrate having formed thereon a first bump pad structure having a first number of supporting metal pads associated with it; and a second region of the substrate having formed thereon a second bump structure having a second number of supported metal pads associated with it, the second number being greater than the first number.
Public/Granted literature
- US20110084390A1 Chip Design with Robust Corner Bumps Public/Granted day:2011-04-14
Information query
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