Invention Grant
- Patent Title: Capacitance detecting device
- Patent Title (中): 电容检测装置
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Application No.: US13347346Application Date: 2012-01-10
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Publication No.: US08624608B2Publication Date: 2014-01-07
- Inventor: Junichiro Oya
- Applicant: Junichiro Oya
- Applicant Address: JP Tokyo
- Assignee: Alps Electric Co., Ltd.
- Current Assignee: Alps Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Brinks Gilson & Lione
- Priority: JP2011-004552 20110113
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
In a capacitance detecting device including an offset adjustment circuit for removing offset from charge transmitted to an integrator from a charge reading mechanism, the offset adjustment circuit includes a variable capacitance element switching the number of capacitative elements connected in parallel to a charge transmission line made up of a plurality of the capacitative elements and setting the number to a predetermined capacitance value; and a capacitative element for adjustment connected in parallel to the variable capacitance element and parallel, and having a capacitance value corresponding to the minimum value of the capacitative elements constituting the variable capacitance element. Driving is controlled so that offset removal is performed only N times (M>N; M and N are natural numbers) in the capacitative element for adjustment while offset removal is repeated M times in the variable capacitance element.
Public/Granted literature
- US20120182028A1 CAPACITANCE DETECTING DEVICE Public/Granted day:2012-07-19
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