Invention Grant
- Patent Title: Fault tolerant integrated circuit architecture
- Patent Title (中): 容错集成电路架构
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Application No.: US13276180Application Date: 2011-10-18
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Publication No.: US08624622B2Publication Date: 2014-01-07
- Inventor: Steven Hennick Kelem , Jaime C. Cummins , John L. Watson , Robert Plunkett , Stephen L. Wasson , Brian A. Box , Enno Wein , Charles A. Furciniti
- Applicant: Steven Hennick Kelem , Jaime C. Cummins , John L. Watson , Robert Plunkett , Stephen L. Wasson , Brian A. Box , Enno Wein , Charles A. Furciniti
- Applicant Address: US CA San Jose
- Assignee: Element CXI, LLC
- Current Assignee: Element CXI, LLC
- Current Assignee Address: US CA San Jose
- Agency: Gamburd Law Group LLC
- Agent Nancy R. Gamburd
- Main IPC: H03K19/003
- IPC: H03K19/003

Abstract:
The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function, providing for the IC to continue the same functioning despite defects which may arise during operation.
Public/Granted literature
- US20120146685A1 Fault Tolerant Integrated Circuit Architecture Public/Granted day:2012-06-14
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