A delay measuring circuit includes a first trigger-signal generating unit that, when a value of a signal input to a circuit under test, changes, generates a first trigger signal. The delay measuring circuit includes a second trigger-signal generating unit that, when a value of a signal output from the circuit under test changes, generates a second trigger signal. The delay measuring circuit includes a delay unit that includes a plurality of delay elements connected in series. The delay measuring circuit includes a delay information retaining unit that individually captures and retains the first trigger signal output from each of the delay elements included in the delay unit between when the first trigger signal is generated by the first trigger-signal generating unit and when the second trigger signal is generated by the second trigger-signal generating unit.