Invention Grant
- Patent Title: Test circuits and methods for redundant electronic systems
- Patent Title (中): 冗余电子系统的测试电路和方法
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Application No.: US13371297Application Date: 2012-02-10
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Publication No.: US08624764B2Publication Date: 2014-01-07
- Inventor: Jeremy Gorbold
- Applicant: Jeremy Gorbold
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Kenyon & Kenyon, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
A redundant analog-to-digital conversion system can include at least one input multiplexer, first and second redundant analog-to-digital converters, a comparison circuit and an output multiplexer. The at least one input multiplexer can receive a plurality of analog input signals and output at lest one multiplexed analog input signal. The first and second redundant analog-to-digital converters can convert the at least one multiplexed analog input signal to respectively generate first and second digital output signals, the first digital output having a greater digital resolution than the second digital output. The comparison circuit can produce a comparison output signal as a function of a comparison of a plurality of most significant corresponding bit pairs of the first and second digital output signals. The output multiplexer can produce a multiplexed output including information from the comparison output signal and one of the digital output signals.
Public/Granted literature
- US20120206282A1 TEST CIRCUITS AND METHODS FOR REDUNDANT ELECTRONIC SYSTEMS Public/Granted day:2012-08-16
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