Invention Grant
- Patent Title: Particle concentration measuring device
- Patent Title (中): 粒子浓度测定装置
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Application No.: US13160100Application Date: 2011-06-14
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Publication No.: US08625099B2Publication Date: 2014-01-07
- Inventor: Kazuhiko Sakamoto , Hiroshi Kawakita , Hiroyuki Okami , Yusuke Iso , Ryuta Okamoto
- Applicant: Kazuhiko Sakamoto , Hiroshi Kawakita , Hiroyuki Okami , Yusuke Iso , Ryuta Okamoto
- Applicant Address: JP Tokyo
- Assignee: Shin Nippon Air Technologies Co., Ltd.
- Current Assignee: Shin Nippon Air Technologies Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Renner Kenner
- Agent Arthur M. Reginelli
- Priority: JP2010-135838 20100615
- Main IPC: G01N21/61
- IPC: G01N21/61

Abstract:
A particle concentration measuring device includes: a measurement region formation part which has a wall (10) of substantially ring-form and through an inner opening of which gas relatively flows orthogonally; a light curtain forming unit (12A, 12B) forming a planar light curtain (FL) in the inner opening: a particle detecting unit (15) receiving scattered light from particles passing through the light curtain (FL) to detect the particles; and a calculating unit (22) calculating particle concentration based on the total number of the particles detected by the particle detecting unit (15) in a volume of an airflow passing through the light curtain (FL) in a unit time.
Public/Granted literature
- US20110304850A1 PARTICLE CONCENTRATION MEASURING DEVICE Public/Granted day:2011-12-15
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