Invention Grant
US08625217B1 Branch metric computation and noise predictive calibration/adaptation for over-sampled Y samples 有权
过采样Y样本的分支度量计算和噪声预测校准/适应

  • Patent Title: Branch metric computation and noise predictive calibration/adaptation for over-sampled Y samples
  • Patent Title (中): 过采样Y样本的分支度量计算和噪声预测校准/适应
  • Application No.: US13628579
    Application Date: 2012-09-27
  • Publication No.: US08625217B1
    Publication Date: 2014-01-07
  • Inventor: Shaohua YangXuebin Wu
  • Applicant: LSI Corporation
  • Applicant Address: US CA San Jose
  • Assignee: LSI Corporation
  • Current Assignee: LSI Corporation
  • Current Assignee Address: US CA San Jose
  • Agency: Advent, LLP
  • Main IPC: G11B20/10
  • IPC: G11B20/10 H04B1/10
Branch metric computation and noise predictive calibration/adaptation for over-sampled Y samples
Abstract:
Techniques are disclosed for performing branch metric computations/noise predictive calibration/adaptation for over-sampled Y samples. In one or more embodiments, the techniques employ a data processing apparatus (circuit) that includes a parallel to serial convertor configured to receive a first stream of sample data (e.g., Y samples) and a second stream of sample data (e.g., Z samples). The parallel to serial convertor is operable to combine the first stream of sample data and the second stream of sample data into a combined stream of sample data (e.g., combined Y and Z samples). The data processing apparatus (circuit) further includes a filter (e.g., a noise predictive finite impulse response (NPFIR) filter, a noise whitening filter, such as a noise predictive calibration/adaptation module (NPCAL) filter, and so forth) that is configured to receive the combined stream of sample data and whiten noise in the combined stream of sample data.
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