Invention Grant
- Patent Title: Branch metric computation and noise predictive calibration/adaptation for over-sampled Y samples
- Patent Title (中): 过采样Y样本的分支度量计算和噪声预测校准/适应
-
Application No.: US13628579Application Date: 2012-09-27
-
Publication No.: US08625217B1Publication Date: 2014-01-07
- Inventor: Shaohua Yang , Xuebin Wu
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Advent, LLP
- Main IPC: G11B20/10
- IPC: G11B20/10 ; H04B1/10

Abstract:
Techniques are disclosed for performing branch metric computations/noise predictive calibration/adaptation for over-sampled Y samples. In one or more embodiments, the techniques employ a data processing apparatus (circuit) that includes a parallel to serial convertor configured to receive a first stream of sample data (e.g., Y samples) and a second stream of sample data (e.g., Z samples). The parallel to serial convertor is operable to combine the first stream of sample data and the second stream of sample data into a combined stream of sample data (e.g., combined Y and Z samples). The data processing apparatus (circuit) further includes a filter (e.g., a noise predictive finite impulse response (NPFIR) filter, a noise whitening filter, such as a noise predictive calibration/adaptation module (NPCAL) filter, and so forth) that is configured to receive the combined stream of sample data and whiten noise in the combined stream of sample data.
Information query