Invention Grant
- Patent Title: Detector pruning control system
- Patent Title (中): 检测器修剪控制系统
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Application No.: US13327279Application Date: 2011-12-15
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Publication No.: US08625221B2Publication Date: 2014-01-07
- Inventor: Wei Feng , Lei Wang
- Applicant: Wei Feng , Lei Wang
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G11B5/09
- IPC: G11B5/09 ; H04B1/66 ; H03M13/03

Abstract:
Various embodiments of the present invention provide apparatuses, systems and methods for data detection in a detector with a pruning control system. For example, a data detector is disclosed that includes a first set of counters operable to distinguish prunable data from non-prunable data in the data detector, a second set of counters operable to generate initial values for the first set of counters, and a prune control signal generator operable to generate a prune control signal based on the first set of counters. The second set of counters is operable to generate the initial values at least in part before a syncmark is detected in a data sector. The initial values are used to initialize the first set of counters when the syncmark is detected in the data sector. The prune control signal controls whether the data detector is allowed to prune a trellis.
Public/Granted literature
- US20130155541A1 Detector Pruning Control System Public/Granted day:2013-06-20
Information query
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